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IEC61032 Test probe B, jointed finger probe
Conforms to:
This is the "international" test probe B required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.
Notes:
Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.
Technical Parameters:
| Kunrled finger diameter | 12mm |
| Knurled Finger length | 80mm |
| Baffle plate diameter | 50mm |
| Baffle plate length | 100mm |
| Baffle thickness | 20mm |