T3Ster- Thermal Transient Tester

• T3Ster carries out thermal transient measurement test in real time in conformance to the static test method described in the JEDEC JESD51-1 standard.
  
• T3Ster is equipt to test IC chipe components or semiconductor like diodes, transistors, tryristors or power LEDs.
  
• This “continuous measurement” technique combined with precision hardware result in capturing very accurate, noise free, real thermal transient curves at high time resolution.
• The T3Ster system consists of a main system unit having a USB interface to the measurement control computer, a power driving module for heating up the components to be measured, sensor current sources and up to 8 measurement channels.